AFM Probe with 4 Different Cantilevers for Various Applications

型号:All-In-One
价格:请致电:010-67529703
品牌:nanoworld

Versatile monolithic silicon AFM probe with 4 different cantilevers on a single AFM holder chip for various applications: contact mode, force modulation mode, soft tapping mode and high frequency tapping / non-contact mode. The short cantilever end is marked by a trapezoidal pattern visible with bare eyes.

The rotated tips allow for more symmetric representation of high sample features. The consistent tip radii ensure good resolution and reproducibility.

The AFM holder chip fits most commercial AFM systems as it is industry standard size. It is compatible with:

  • Bruker / Veeco / Digital Instruments
  • Keysight / Agilent / Molecular Imaging
  • Asylum Research
  • Park Systems
  • JEOL
  • JPK
  • etc.

The main advantage of this product compared to regular, single-cantilever AFM probes is the freedom to choose in the very last moment the right cantilever for each application. You do not need to stock various AFM Probe types any more. Nevertheless, this product is not meant as a substitution to comparable single-cantilever AFM probes, because the geometry of each one of the All-In-One cantilevers differs from the geometry of comparable specialized single-cantilever AFM probes.

Consistent high quality at a lower price!

 

Coating Description

Uncoated

Full Technical Data

AFM Tip:

  • Shape: Rotated
  • Height: 17 ?m (15 - 19 ?m)*
  • Setback: 15 ?m (10 - 20 ?m)*
  • Radius: < 10 nm
  • Half Cone Angle: 20°-25° front view, 25°-30° from side, 10° at the apex
  • AFM Cantilevers:

    Cantilever A - Contact Mode
  • Shape: Beam
  • Force Constant: 0.2 N/m (0.04 - 0.7 N/m)*
  • Resonance Frequency: 15 kHz (10 - 20 kHz)*
  • Length: 500 ?m (490 - 510 ?m)*
  • Width: 30 ?m (25 - 35 ?m)*
  • Thickness: 2.7 ?m (1.7 - 3.7 ?m)*
  • Cantilever B - Force Modulation
  • Beam
  • 2.7 N/m (0.4 - 10 N/m)*
  • 80 kHz (50 - 110 kHz)*
  • 210 ?m (200 - 220 ?m)*
  • 30 ?m (25 - 35 ?m)*
  • 2.7 ?m (1.7 - 3.7 ?m)*