Standard Tapping Mode AFM Probe

型号:PPP-RT-NCHR
价格:请致电:010-67529703
品牌:nanoworld

The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The excellent tip radius and the minimized variation in tip shape provide more reproducible images and enhanced resolution.

NANOSENSORS? PPP-RT-NCHR probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). This AFM probe combines high operation stability with outstanding sensitivity and fast scanning ability.

For certain applications the rotated PointProbe® Plus Tip offers more symmetric imaging. The rotated tip shape is identical to the classic tip shape but it is rotated by 180° degrees with respect to the cantilever beam direction.

The probe offers unique features:

  • excellent tip radius of curvature
  • highly doped silicon to dissipate static charge
  • high mechanical Q-factor for high sensitivity

Coating Description

The reflex coating is an approximately 30 nm thick aluminum coating on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 2% of the cantilever length.

Full Technical Data

AFM Tip:

  • Shape: Rotated
  • Height: 10 - 15 ?m
  • Radius: < 7 nm (< 10 nm guaranteed)
  • AFM Cantilever:

  • Shape: Beam
  • Force Constant: 42 N/m (10 - 130 N/m)*
  • Resonance Frequency: 330 kHz (204 - 497 kHz)*
  • Length: 125 ?m (115 - 135 ?m)*
  • Width: 30 ?m (22.5 - 37.5 ?m)*
  • Thickness: 4 ?m (3 - 5 ?m)*